Physical measurement and analysis of thin films, with contribns by W A Pliskin and others.

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Language: ENG Publication details: New York Plenum Pr 1969Subject(s):

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Holdings
Item type	Current library	Call number	Status	Notes	Date due	Barcode
Book	Prof. S.S.Basavanal Library	C21117 K9 (Browse shelf(Opens below))	Available	104705		104705

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Previous	C21117 K6 Vacuum sealing techniques.	C21117 K8 Vacuum System design	C21117 K8 Thin film technology, by Robert W Berry, Peter M hall and Murray T Harris.	C21117 K9 Physical measurement and analysis of thin films, with contribns by W A Pliskin and others.	C21117 K9-;1 thin film Phenomena (cops 2)	C21117 K9-;1 thin film Phenomena (cops 2)	C21117 L0 Vacuum deposition of thin film	Next

Progress in analytical chemistry, ed by Ivor L simmons and Paul Lublin.

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